MMLog

Today, I had the distinct privilege of attending and presenting at the first ever meeting of the International Association of Computerized Adaptive Testing.  Wow!  The diversity of theoreticians, practitioners, and supporters of CAT around the globe is fantastic.  We had folks from 30 different countries in attendance.  This is the logical extension of the conferences put together by GMAC […]

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OK, so it’s not April or May anymore.  Yes, it’s a little late to be providing a review of the Spring conferences put on by the International Objective Measurement Workshop and the National Council on Measurement in Education. Better late than never. IOMW is the biennial Rasch modeling conference.  I attend a few times in the 90s but […]

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Greetings!  It’s that wonderful time of the year, when testing professionals from around the world come together to commune, celebrate warm weather and engage in show and tell.  What am I talking about?  The annual Innovations in Testing Conference sponsored by the Association of Test Publishers.  Newbies to testing are encouraged to attend as are […]

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Introduction: Recently, we ran a reliability analysis for a client that is worth sharing. The certification exam had about 400 items and the reliability came in under .80 as measured by Cronbach’s Alpha (Cronbach, 1951), an undesirable if not unacceptable reliability for any test let alone a test containing 400 items. (NOTE: Mountain Measurement didn’t […]

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There have not been too many court cases related to the testing industry that are commonly cited as landmark cases. It is for this reason that the recent decision by the U.S. Supreme Court in The Ricci, et. al. vs. DeStefano, et. al. case may be cited for years to come. In this case, the […]

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A few weeks ago, I had the privilege of making the annual trek to the AERA/NCME annual meeting. Typically, I’m quite cynical about this event, but this year I was pleasantly surprised. The program was well done, the presentations were pretty darn good, and the people I chatted with stimulated me. All in all, I […]

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