Brian D. Bontempo, PhD. – MMlog
Filed in on Mar.09, 2009
-
Recent Posts
Recent Comments
Categories
Tags
AERA Association of Testing Publishers Automated Report Generation CAT Classical Test Theory Computerized Adaptive Testing correlation Criterion-Referenced Test Cronbach's Alpha CRT CTT data analysis database Data Collection Data Information Knowledge Wisdom Data Management Differential Item Functioning Excel Fit Statistics IACAT Innovation IRT Item Exposure Control Mechanisms Item Quality Metrics Item Response Theory Mastery Test MIRT Multi-dimensional IRT NCLEX Program Reports NCME New Haven Firefighters Norm-Referenced Test NRT point biserial Point Biserial Correlation Coefficient Progressive Method Psychometrics Psychometrics Blog pt bis Rasch Reliability Ricci v. DeStefano SQL Test Development Test Development BlogLinks
Other Friendly Folks
Meta
December 12th, 2014 at 2:07 pm
Dear Brian,
I would like to invite you to be the keynote speaker for the upcoming IMIA Congress to be held in April in Washington DC, theme: United we are stronger.
We are not in a position to pay but we have 400-600 attendees annually and you presented for one of our smaller events in Oregon I believe and I really liked it that you had an overall overview of what a profession needs to evolve. If you are interested I’d love to tell you more about it. Just call me at 781 801 6898 or let me know how to get in touch with you. Info of event here:http://www.imiaweb.org/conferences/2015conference.asp
time frame for keynote 10-11am on Friday April 24, 2015.
Best,
Izabel Arocha
IMIA Executive Director
cell 781 801 6898
iarocha@imiaweb.org